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Tessent Streaming Scan Network (SSN): No-compromise DFT by Peter Orlando, Siemens EDA


The increasing complexity in large System on Chip (SoC) designs present challenges to design-for-test (DFT). Hierarchical DFT is no longer enough. Tessent Streaming Scan Network (SSN) technology eliminates the difficult and costly trade-offs between DFT implementation effort and manufacturing test cost by decoupling core-level and chip-level DFT. With SSN, a true no-compromise approach to DFT is possible.


Peter who has been working for Siemens since 2018 is a member of the Tessent DFT technical marketing team. Pete’s primary focus during his time at Siemens has been the development and successful deployment of Streaming Scan Network (SSN) product. As the customer facing technical lead for the SSN product, Pete has been teaching and providing guidance to internal colleagues and external customers on how to implement SSN. Pete’s role in SSN continues to expand with the development and deployment of new features being added to SSN regularly. Prior to joining Siemens, Pete has worked in the silicon industry for 25 years, with most of that time in the field of DFT, for such companies as Marvell Semiconductor, Micron Technology, ST Microelectronics, and LSI logic.

SemIsrael Tech Webinar 5-4-2022 (9 videos)

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