In-System Test, A Critical element to SLM, by Lee Harrison , Tessent Product Marketing Director, Siemens EDA
Continuous testing and monitoring of devices is required to guarantee optimal performance, reliability and safety throughout their operation. Tessent In-System Test enables the application of high-quality deterministic test patterns as part of an SLM Implementation
BIO:Lee Harrison is Director, Product Marketing, with Siemens Tessent Division. He has over 20 years of industry experience with Siemens Tessent DFT products and has been involved in the specification of new test features and methodologies for Siemens customers. Lee received his BEng in MicroElectronic Engineering from Brunel University London in 1996. Lee presents regularly at industry conferences such as DAC, ITC, VTS, ETS, ATS, DATE etc.
More info:
https://www.sw.siemens.com/en-US/
lee.harrison@siemens.com
