Semisrael Videos

Chain diagnosis is a powerful tool to localize manufacturing defects that cause scan chain shifting to fail. In this talk, we will explore 3 new technologies that further advance the localization of chain defects.
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BIO:
Jayant D’Souza is the technical product director for yield learning products in the Siemens EDA Tessent® group. Jayant holds an MSEE degree from the University of North Carolina at Charlotte (USA). He has about 20 years of experience in the design-for-test (DFT), automatic test pattern generation (ATPG), scan diagnosis and yield learning areas. He is currently focused on the application of DFT and scan on defect diagnosis and yield learning.

More info:

https://www.sw.siemens.com/en-US/
jayant.dsouza@siemens.com