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Design-For-Test Design (DFT) Consideration for Automotive Designs by Ijeoma Ebhogiaye​, Veriest


These days we hear DFT concepts for automotive devices being regularly discussed within the industry. However, this was not always the case. DFT was previously thought of as an afterthought or mundane task. Now, with the advancement of automotive design, DFT can be appreciated for what it is. A chip design facet that is evolving, with innovation and interesting challenges that arise alongside. The scope of this paper is on DFT consideration for executing automotive projects. Traditionally, DFT engineers have always pushed for DFT considerations to start at project conception. With automotive this requirement has pushed even further upstream to system level. DFT as we know, is about manufacturing defects, and shipping products with extremely low Defective Parts Per Million (DPPM). Automotive brings additional requirements of safety and reliability which involves In-System Test (IST). Careful consideration of aspects of DFT methodologies are needed to maintain high coverage, aiming for low DPPM, and still allowing for the ability for In-System Test that meets ISO26262 safety standard. In this paper, we further explore how DFT plays an integral part of chip design execution and why careful consideration must be taken when undertaking automotive projects.


Ijeoma has over 25 years VLSI experience with expertise in Design for Test. She has developed automotive LBIST implementation flow. Technically led tape-out at TSMC 16nm FFC. She has led DFT team from architectural specification to production. Previously worked at Philips/NXP, Intel. Ijeoma holds an MSc in Microelectronics System Design and PHD in Digital Test from Brunel University, London.

SemIsrael Tech Webinar 5-4-2022 (9 videos)

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