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Probe pin and socket data sheet show usually the contact resistance in ideal conditions. With a design of experiment (DOE), the behavior and change of contact resistance over 1000 hours in HTOL environment has been analyzed. Data show what happens during ramp up, hold and ramp down temperature and give an explanation about a resistance jump after re-insertion of the DUT after read-outs.
Bernhard joined Yamaichi Electronics Germany in 2008 and is product manager for customized probe pin sockets. He works closely with customers to identify test solution for silicon validation, reliability, ATE and failure analysis. As product manager he is also in interaction with the Yamaichi European Design Center in Munich and Sousse and factory in Frankfurt/Oder.
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